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-"As threshold voltages are reduced, subthreshold leakage rises exponentially."

I'd like to have a citation on that line, please! Thank you! —The preceding unsigned comment was added by 132.210.72.131 (talk) 02:09, 16 May 2007 (UTC).[reply]


-The first reference in References section:

Tsividis, Yannis (1999). Operation and Modeling of the MOS Transistor (2 ed.). New York: McGraw-Hill. p. 99. ISBN 0-07-065523-5.

points to an incorrect book:

Classical and object-oriented software engineering with UML and C++ by Schach, Stephen R

I could not find a proper source to point to, if you have one - please fix.